Sec S3c2443x Test B D Driver Review
/* 3. Initialize hardware */ sec_testbd_reset(testbd); sec_testbd_configure(testbd, DEFAULT_MODE);
/* 1. Acquire memory region */ res = platform_get_resource(pdev, IORESOURCE_MEM, 0); testbd->base = devm_ioremap_resource(&pdev->dev, res); if (IS_ERR(testbd->base)) return PTR_ERR(testbd->base);
# Verify device node ls -l /dev/sec_testbd # → crw-rw---- 1 root video 250, 0 Mar 23 12:34 /dev/sec_testbd
struct sec_testbd_dma_desc __u64 src_addr; /* Physical address of source buffer */ __u64 dst_addr; /* Physical address of destination buffer */ __u32 length; /* Transfer size in bytes (max 4 MiB) */ __u32 flags; /* SEC_TESTBD_DMA_ENCRYPT ; The driver writes the descriptor into the SMI registers, triggers the transfer, and waits for the completion interrupt. Errors such as address misalignment or length overflow generate -EINVAL . Through SEC_TESTBD_IOCTL_CRYPTO , the user can request a single‑shot operation:
/* 2. Request IRQ */ ret = devm_request_irq(&pdev->dev, platform_get_irq(pdev, 0), sec_testbd_isr, 0, dev_name(&pdev->dev), testbd); if (ret) return ret;
The Sec S3c2443x Test B D Driver is a reference implementation of a low‑level device driver for the Sec S3c2443x series of System‑on‑Chip (SoC) peripherals. It is primarily used in embedded Linux environments to validate the functionality of the “Test B D” hardware block, which provides a programmable interface for secure data handling, cryptographic acceleration, and DMA‑based I/O.
# Run a cryptographic hash benchmark ./testbd_tool --crypto --algo sha256 --src 0x82000000 --len 4194304
| Parameter | Meaning | |-----------|---------| | mode | 0 = buffer‑overflow test, 1 = timing jitter, 2 = fault‑injection | | iterations | Number of stress cycles (max 10 000) | | seed | Pseudo‑random seed for pattern generation |
/* 4. Register char device */ ret = alloc_chrdev_region(&dev_num, 0, 1, "sec_testbd"); if (ret) return ret; cdev_init(&testbd->cdev, &sec_testbd_fops); testbd->cdev.owner = THIS_MODULE; ret = cdev_add(&testbd->cdev, dev_num, 1); if (ret) goto err_unregister;
device_create(class, NULL, dev_num, NULL, "sec_testbd"); return 0;
err_unregister: unregister_chrdev_region(dev_num, 1); return ret;
struct resource *res; int ret;
struct sec_testbd_crypto_req __u32 algo; /* SEC_ALGO_AES256, SEC_ALGO_SHA256, etc. */ __u32 mode; /* ENCRYPT, DECRYPT, HASH */ __u64 key_addr; /* Physical address of key material */ __u64 src_addr; /* Input data buffer */ __u64 dst_addr; /* Output buffer (or NULL for hash) */ __u32 length; /* Data length */ ; The driver programs the CE registers, starts the operation, and returns the status. The CE can process up to 64 KB per command; larger payloads are automatically split. The driver provides a special ioctl SEC_TESTBD_IOCTL_STRESS that configures the internal test logic:
/* 3. Initialize hardware */ sec_testbd_reset(testbd); sec_testbd_configure(testbd, DEFAULT_MODE);
/* 1. Acquire memory region */ res = platform_get_resource(pdev, IORESOURCE_MEM, 0); testbd->base = devm_ioremap_resource(&pdev->dev, res); if (IS_ERR(testbd->base)) return PTR_ERR(testbd->base);
# Verify device node ls -l /dev/sec_testbd # → crw-rw---- 1 root video 250, 0 Mar 23 12:34 /dev/sec_testbd
struct sec_testbd_dma_desc __u64 src_addr; /* Physical address of source buffer */ __u64 dst_addr; /* Physical address of destination buffer */ __u32 length; /* Transfer size in bytes (max 4 MiB) */ __u32 flags; /* SEC_TESTBD_DMA_ENCRYPT ; The driver writes the descriptor into the SMI registers, triggers the transfer, and waits for the completion interrupt. Errors such as address misalignment or length overflow generate -EINVAL . Through SEC_TESTBD_IOCTL_CRYPTO , the user can request a single‑shot operation:
/* 2. Request IRQ */ ret = devm_request_irq(&pdev->dev, platform_get_irq(pdev, 0), sec_testbd_isr, 0, dev_name(&pdev->dev), testbd); if (ret) return ret;
The Sec S3c2443x Test B D Driver is a reference implementation of a low‑level device driver for the Sec S3c2443x series of System‑on‑Chip (SoC) peripherals. It is primarily used in embedded Linux environments to validate the functionality of the “Test B D” hardware block, which provides a programmable interface for secure data handling, cryptographic acceleration, and DMA‑based I/O.
# Run a cryptographic hash benchmark ./testbd_tool --crypto --algo sha256 --src 0x82000000 --len 4194304
| Parameter | Meaning | |-----------|---------| | mode | 0 = buffer‑overflow test, 1 = timing jitter, 2 = fault‑injection | | iterations | Number of stress cycles (max 10 000) | | seed | Pseudo‑random seed for pattern generation |
/* 4. Register char device */ ret = alloc_chrdev_region(&dev_num, 0, 1, "sec_testbd"); if (ret) return ret; cdev_init(&testbd->cdev, &sec_testbd_fops); testbd->cdev.owner = THIS_MODULE; ret = cdev_add(&testbd->cdev, dev_num, 1); if (ret) goto err_unregister;
device_create(class, NULL, dev_num, NULL, "sec_testbd"); return 0;
err_unregister: unregister_chrdev_region(dev_num, 1); return ret;
struct resource *res; int ret;
struct sec_testbd_crypto_req __u32 algo; /* SEC_ALGO_AES256, SEC_ALGO_SHA256, etc. */ __u32 mode; /* ENCRYPT, DECRYPT, HASH */ __u64 key_addr; /* Physical address of key material */ __u64 src_addr; /* Input data buffer */ __u64 dst_addr; /* Output buffer (or NULL for hash) */ __u32 length; /* Data length */ ; The driver programs the CE registers, starts the operation, and returns the status. The CE can process up to 64 KB per command; larger payloads are automatically split. The driver provides a special ioctl SEC_TESTBD_IOCTL_STRESS that configures the internal test logic:
